Soft X - ray absorption spectroscopy study of the effects of Si , Ce , and Mo ion implantation on the passive layer of AISI 304 stainless steel
نویسنده
چکیده
The chemical modifications introduced in the passive layer of AISI 304 stainless steel after Si, Ce, and Mo ion implantation were investigated and compared with non-implanted steel by soft X-ray absorption spectroscopy. The influence of ion implantation on the passive properties was evaluated by measuring soft X-ray absorption spectra at the Cr, Fe, Ni, Mn and Si 2p in addition to oxygen 1s thresholds. All ion implanted samples show a relative Crenrichment at the surface as compared with non-implanted samples. Fe 2p as well as O 1s spectral changes reveal chemical differences in the passive layer as a function of the element ion-implanted. 2003 Elsevier Science Ltd. All rights reserved.
منابع مشابه
Applications of soft X-ray absorption spectroscopy to the study of passive and oxide layers on stainless steels: influence of ion implantation
Soft X-ray absorption spectroscopy (XAS) has been used to study the influence of Si ion implantation on the passive layer of AISI 304 stainless steel, as well as on its high-temperature oxidation behaviour. Ion implantation is a usual technique to improve the corrosion and oxidation resistance of steels. To study the effects of ion implantation on the room temperature corrosion behavior of AISI...
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